REDLAB 359 – NANOMEC
- José Sánchez del Río / Srdjan Milenkovic
- 91 549 34 22 1043
FIB-FEGSEM dual-beam microscope (Helios NanoLab 600i, FEI)
Fully equipped with STEM detector, X-Ray microanalysis (EDS) and electron backscatter diffraction (EBSD) for 3D microstructural, chemical and crystallographic orientation analysis. The system is also suited for site-specific TEM sample preparation, micro machining and patterning by ion-beam milling.
Use in the project: advanced microstructural characterization of materials.
NANOMEC Laboratory. IMDEA Materials facilities (Tecnogetafe)
FEG S/TEM microscope (Talos F200X, FEI)
Combines high-resolution S/TEM and TEM imaging with an energy dispersive X-ray spectroscopy (EDS) integrated system fully compatible with high-resolution 3D tomography. It is also equipped with a PicoIndenter platform to perform nano-mechanic in situ tests.
Use in the project: Advanced microstructural characterization of materials.
NANOMEC Laboratory. IMDEA Materials facilities (Tecnogetafe)
Scanning electron microscope (EVO MA15, Zeiss)
With chemical microanalysis EDS Oxford INCA 350, with automated pressure regulation from 10 to 400 Pa to work with non-metallic samples without the need of metalizing.
Use in the project: Microstructural characterization of materials.
NANOMEC Laboratory. IMDEA Materials facilities (Tecnogetafe)
X-ray diffractometer (Empyrean, PANalytical)
Multi-purpose research diffractometer for phase analysis, texture, and residual stress determination, as well as reflectometry. It is equipped with a state-of-the-art X-ray platform for the analysis of powders, thin films, nanomaterials and solid samples. The device is furnished with exchangeable tubes of Cu and Cr radiation, with three sample stages (standard, reflection-transmission spinner and Chi-Phi-x-y-z), an automated sample changer, and a linear detector (PIXcel 1D).
Use in the project: Phase identification, residual stress and texture characterization of materials.
NANOMEC Laboratory. IMDEA Materials facilities (Tecnogetafe)
C-scan ultrasound non-destructive inspection system (TecniTest)
Equipment to detect and evaluate defects by non-destructive ultrasounds technique. The system finds and determines the size and position of the typical defects in composite materials (voids, delaminations, cracks, etc.).
Use in the project: Non-destructive evaluation of composite materials.
NANOMEC Laboratory. IMDEA Materials facilities (Tecnogetafe)
Atomic Force Microscope (Park XE150)
To carry out nanoscale characterization of materials, including non-contact and contact atomic force microscopy. Additional features include magnetic microscopy, thermal microscopy, nanolithography and a high temperature stage to carry out measurements up to 250ºC.
Use in the project: Surface characterization.
NANOMEC Laboratory. IMDEA Materials facilities (Tecnogetafe)
X-ray computer-assisted 3D nanotomography scanner (Nanotom, Phoenix)
For three-dimensional visualization and quantitative analysis of microstructural features in a wide variety of materials ranging from metal powders and minerals to polymers and biomaterials. The scanner combines a 160 KV X-ray source to study highly absorbing materials together with a nanofocus tube to provide high resolution (0.2-0.3 µm detail detectability).
Use in the project: Non-destructive characterization of materials.
NANOMEC Laboratory. IMDEA Materials facilities (Tecnogetafe)
Mechanical stage for in-situ testing in X-ray tomography (μTM, IMDEA Materials Institute)
To carry out in-situ mechanical tests under X-ray radiation in computer assisted tomography systems. The stage, designed and developed in-house, can be used both at synchrotron radiation facilities and inside laboratory tomography systems, for the investigation of the damage initiation and propagation in a wide variety of materials.
Use in the project: In-situ mechanical testing of fabricated materials.
NANOMEC Laboratory. IMDEA Materials facilities (Tecnogetafe)
High Temperature Nanoindentation system (Nanotest Vantage, Micro Materials)
This instrument allows nanoindentation to be carried out at temperatures up to 750°C, and also in inert environments. The instrument uses both tip and sample heating, ensuring stability for long duration testing, including creep tests. This is the first dedicated high temperature nanoindentation instrument in Spain.
Use in the project: Micromechanical characterization of materials.
NANOMEC Laboratory. IMDEA Materials facilities (Tecnogetafe)
Nanoindentation system (TI950, Hysitron)
The capabilities include nanoindentation with several loading heads tailored for different applications (maximum load resolution, 1 nN), dynamic measurements, scratch and wear testing and SPM imaging and modulus mapping performed with the same indenter tip.
Use in the project: To perform instrumented nanoindentation, as well as other nanomechanical testing studies, such as micropillar compression in a range of materials, including tests at temperatures up to 500 ºC.
NANOMEC Laboratory. IMDEA Materials facilities (Tecnogetafe)
In-situ nanoindenter to carry out elevated temperature mechanical testing inside a SEM (PI87, Hysitron)
Nanoindenter stage to carry out mechanical tests inside a scanning electron microscope (SEM) for the in-situ observation of the deformation mechanisms. The stage allows the simultaneous acquisition of the load-displacement record and the SEM images during mechanical testing (nanoindentation, micro-compression, micro-bending, micro-tension) of micrometer and sub-micrometer size volumes, including elevated temperature testing.
Use in the project: In-situ micromechanical characterization of materials.
NANOMEC Laboratory. IMDEA Materials facilities (Tecnogetafe)
Micromechanical testing stages (Kammrath and Weiss)
To observe the specimen surface upon loading under light, scanning electron, focused ion-beam, scanning ultrasonic, or atomic force microscopy. Two stages prepared for tension/compression and fibre tensile testing are available, with maximum loads of 10 kN and 1 N, respectively. They work up to 650 ºC.
Use in the project: In-situ mechanical characterization of materials.
NANOMEC Laboratory. IMDEA Materials facilities (Tecnogetafe)
High Resolution Dilatometer (DIL 402 Expedis Supreme)
It is a horizontal pushrod dilatometer for determination of dimensional changes as a function of temperature (in the temperature range of 20-1600 oC) on the basis of DIN EN 821, DIN 51045, ASTM E831 or ASTM E288 standards. The measurements can be carried out in vacuum, inert or oxidizing gas atmosphere. The dilatometer is equipped by novel “NanoEye” optoelectronic sensor with unmatched resolution (0.1 nm) over the entire measuring range, which allows direct sequential measurement of samples of different lengths and with different expansion behaviour at maximum precision.
Use in the project: Measurements of thermal expansion coefficient, determination of phase transformation temperatures and analysis of precipitation kinetics
NANOMEC Laboratory. IMDEA Materials facilities (Tecnogetafe)
