REDLAB 189 – CENIM(CSIC)-FA

  • José Antonio Jiménez Rodríguez & Irene Llorente Carrasco
  • +34 91 553 89 00 & +34 91 534 74 25 (Fax)
  • X-Rays Laboratory; Centro Nacional de Investigaciones Metalúrgicas (CSIC);
    Avda. Gregorio del Amo, 8;
    28040-Madrid

Bruker S8 tiger X-ray fluorescence spectrometer

Qualitative, semiquantitative and quantitative analysis of elements with atomic number from sodium (Na) to Uranium (U) in the concentration from 100 % down to the ppm-level of solid samples.

Use in the project:  Control of deviations from the desired chemical composition

Main features:

  • X-ray tube with Rh anode at a maximum output of 4kW (60kV max- 170 mA max) with 75 μm Be Window and primary radiation filters.
  • Automatic mask changer to adjust the sample size.
  • Four position collimator changer to make the optimal choice between intensity and resolution.
  • Sample and spectrometer chamber separated by a programmable air lock.
  • 5 cristales analizadores (XS-55, PET, LiF (200), LiF (220) and LiF (420)) to break down the fluorescence spectrum into the specific wavelengths for the elements.
  • proportional counter and scintillation counter for detection of light and heavier elements, respectively.

Fischerscope XUV energy Micro-x-ray fluorescence-spectrometer

Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to analyze thin coatings, small structures, trace elements and alloys.

Use in the project: Evaluation of macro-segregations of   alloying elements

Main characteristics:

  • Micro focus X-ray tube with Rhodium target working at 8, 20 and 50kV.
  • Measurement up to 24 elements simultaneously with atomic number from Sodium to Uranium in vacuum or in ambient air.
  • 4 changeable apertures with 0.1 , 0.3, 1 and 3 mm of diameter.
  • Video camera for alignement and area selection.
  • SDD Silicon Drift Detector, peltier-cooled X ray detector.
  • Analysis of solid and coating systems without calibration by fundamental parameter method.

Siemens D5000 X-ray diffractometer

Microstructural characterization of polycrystalline materials: Qualitative and quantitative phase analysis, determination of residual stress and textures, crystallite size and microstrain analysis.

Use in the project: Qualitative and quantitative phase analysis to determine the presence of unwanted compounds. Evaluation of residual stress and texture introduced by processing

Main features:

  • Theta/2-Theta Base Goniometer working in Bragg-Brentano focusing geometry equipped with Cu X ray tube and graphite diffracted beam monochrometer.
  • Central open Euler ring with motorized Chi(tilt) and Phi(rotation) rotations and scanner in X.
  • Puntual scintillator detector.

Bruker AXS D8 Advance X-ray diffractometer

Microstructural characterization of polycrystalline materials: Qualitative and quantitative phase analysis, determination of residual stress and textures, crystallite size and microstrain analysis.

Use in the project: Qualitative and quantitative phase analysis to determine the presence of unwanted compounds. Evaluation of residual stress and texture introduced by processing.

Main features:

  • Theta/2-Theta Base Goniometer working in parallel-beam geometry with Göbel Mirror and Co X ray tube.
  • Centric 1/4-Circle Eulerian Cradle with motorized Chi(tilt) and Phi(rotation) rotations and X-Y-Z translations.
  • Laser/video Sample alignment System.
  • Ultra-fast  Bruker LYNXEYE linear detector.